FSM Nanoview 1000

The cheapest AFM with high resolution for contactnon-contact modes

Features

  • Spring suspension offers a strong anti-vibration performance
  • Precision laser detection and probe alignment device make laser adjustment simple and easy;
  • Scan by sample.
  • High-accuracy and wide range sample positioning allow to scan the area of interest ;
  • Top view optical microscope for laser alignement and sample positioning.
  • Scanners : 10×10 um, 20×20 um or 50×50 um
  • Resolution: Lateral  0.2 nm ,  Vertical 0.05 nm
  • Images:   512×512 px
  • Modes: Contact, Tapping, Friction, Phase, EFM, MFM
  • Scan speed:  0.6Hz – 4 Hz
  • Max sample dimensions: φ<90 mm H<20 mm
  • Operating system : Windows XP/7/8/10