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ATOMIC FORCE MICROSCOPES



New version of Haynes-Shockley experiment

New version of Rüchardt experiment for measuring Cp/Cv in gases

New Version of Hall Effect vs temperature

Innovative MicroWave Optics System

Spectroscopic measurement of Energy Gap in semiconductors

Measurement of resistance vs. temperature for various materials

Wilberforce pendulum

Diffraction and Polarization

Peltier Cell

Light speed measurements

Electromagnetic gun

Tesla transformer



NanoTutor SPM


The cheapest educational SPM  for AFM, STM and Microlithography

Automated tip-etching device for NanoTutor
TipEtchingDevice



   FSM- 1000   The cheapest High resolution AFM
FSM-1000
Features

  • Scan head offers a strong anti-vibration performance
  • Precision laser detection and probe alignment make simple laser adjustment
  • Scan by sample
  • High-accuracy and wide range sample positioning allow to scan the area of interest
  • Top view optical microscope for easy sample positioning
  • Scanners : 20x20um or 50×50 um
  • Resolution: Lateral 0.2 nm , Vertical 0.05 nm
  • Images:  512×512 px
  • Modes: Contact, Tapping (optional: Friction, Phase, EFM, MFM)
  • Scan speed: 0.6Hz – 4 Hz
  • Max sample dimensions:  Diameter up to 90 mm , Thickness up to 20 mm
  • Operating systems : Windows XP, Windows 7, Windows 10