AFM-ENG

Scanning Probe Microscopy (SPM) 

for research and education

 

FSM Nanoview-1000/2000:

the cheapest high resolution AFM


Features

  • Spring-suspended head offers a strong anti-vibration performance
  • Precision laser detection and probe alignment device make laser adjustment simple and easy
  • Scan by sample
  • High-accuracy and wide range sample positioning
  • Top view optical microscope for laser alignement and sample positioning.
  • Scanners:  standard  20×20 um; optional 10×10 um ,  50×50 um ,  100×100 um
  • Resolution: Lateral  0.2 nm ,  Vertical 0.05 nm
  • Images:   512×512 px
  • Optical magnification : standard 4X, resolution 2.5 um; optional 10X or 20X
  • Standard modes: Contact, Tapping; optional modes : Phase, EFM, MFM, LFM
  • Scan speed:  0.6Hz – 4 Hz
  • Max sample dimensions: φ<90 mm H<20 mm
  • Operating system : Windows XP/7/8/10

Nanoview_brochure

 

NanoTutor SPM: an AFM with self-made tips and with Tunneling and Force lithography features

Features:

  • Scanning Force Microscope (SFM)
  • Scanning Tunneling Microscope (STM)
  • Spectroscopy and Microlithography SPM
  • User-friendly interface
  • Easy replaceable probes
  • Self-made tips by chemical etching with automated procedure
  • Scanner: 70x70x10 microns
  • Operating system : Windows XP/7