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Welcome to LabTrek srl

Educational experiments for advanced Physics Lab
Low-cost NanoTechnology Laboratory : educational AFM-SPM
Design and Production of Exhibits for Science Museums

About

LabTrek is a small firm, born as spin-off of Bologna and Padova universities, to share the experience acquired in teaching courses of Physics Lab.

    • LabTrek designes and produces experimental apparatuses for advanced Physics Lab.
    • On demand, LabTrek designes and produces exhibits for Science Centers.
    • On demand, LabTrek designes and produces custom devices for industrial application.

 

LabTrek is the european dealer of low-cost AFM:

  • FSM Nanoview  a very low-cost, high resolution,  contact/non-contact AFM (optional:  MFM, EFM, Lateral force and Phase imaging)
  • NanoTutor SPM,  performing AFM, STM analysis and MicroLithography

A textbook on SPM:
fundamentals_of_scanning_probe_microscopy

Short introduction to SPM:
spm2017 ENG

 

List of our customers :
Laboratoire de Physique de la Matière Condensée, Palaiseau, France
Centre for GaN Materials & Devices, University of Sheffield, UK
Dept. of Electronic and Electrical Engineering, University of Sheffield, UK
School of Physics and Astronomy, Manchester Univ., Manchester, UK
Physics Dept. of Lancaster University , Lancaster, UK
Faculty of Technology and Maritime Sciences (TekMar), Toensberg, Norway
The Open University, Raanana, Israel
Hebrew University of Jerusalem, Israel
Virginia Tech – Dept. of Science & Engineering ,Blacksburg – VA,  USA
Columbia Univ. – Applied Physics & Applied Mathematics Dept.- NY, USA
San Diego State University, Miami – FL, USA
The University of Queensland , Australia
Physics Dept., Dublin City University , Ireland
Dept. Sciences et Genie des Materiaux (SGM) Rennes Cedex , France 
ZHAW Zürcher Hochschule für Angewandte Wissenschaften School of Engineering , Winterthur, Switzerland
Lyceum Alpinum, Zuoz, Switzerland
Institut für Geowissenschaften, Universität Freiburg,Freiburg, Germany
Friedrich-Alexander-Universität (FAU) Erlangen-Nurnberg, Germany
Lehrstuhl für Angewandte Festkörperphysik, Bochum, Germany
Physikalisches Institut. Nussallee ,Germany
Faculty of Chemistry and Chem. Tech, University of Ljubljana, Slovenia
Faculty of Mechanical Engineering, University of Maribor, Slovenia
Dip. Chimica, Università Ca Foscari, Venezia, Italy
Dip. Fisica, Università di Cagliari, Italy
Dip. Scienza Applicata e Tecnologia , Politecnico di Torino, Italy
Dip. Ingegneria, Università La Sapienza, Roma, Italy
Dip. Fisica e Astronomia, Università di Padova, Italy
Dip. Fisica e Astronomia, Università di Bologna, Italy
Dip. Fisica, Università di Cagliari, Italy
Dip. Scienze Matematiche Informatiche e Fisiche, Univ. di Udine , Italy
CNR-ISMN, Ist. per lo Studio dei Materiali Nanostrutturati, Bologna, Italy

 

    • Temporary partnerships:
      FermiumLabs – Padova, Italy
      Officina DSG – Curtarolo , Italy
      Millennium Engineering – Villa del Conte , Italy
      Plastigraf – Camin, Padova
      Dipartimento di Scienza e Alta Tecnologia – Università dell’Insubria, Como, Italy
      NT-SPb Saint-Petersburg, Russia
      Suzhou FlyingMan Precision Instruments, Shanghai, China
      Delta Sistemi, Roma, Italy

AFM-ENG

Scanning Probe Microscopy (SPM) 

for research and education

 

FSM Nanoview-1000/2000:

the cheapest high resolution AFM


Features

  • Spring-suspended head offers a strong anti-vibration performance
  • Precision laser detection and probe alignment device make laser adjustment simple and easy
  • Scan by sample
  • High-accuracy and wide range sample positioning
  • Top view optical microscope for laser alignement and sample positioning.
  • Scanners:  standard  20×20 um; optional 10×10 um ,  50×50 um ,  100×100 um
  • Resolution: Lateral  0.2 nm ,  Vertical 0.05 nm
  • Images:   512×512 px
  • Optical magnification : standard 4X, resolution 2.5 um; optional 10X or 20X
  • Standard modes: Contact, Tapping; optional modes : Phase, EFM, MFM, LFM
  • Scan speed:  0.6Hz – 4 Hz
  • Max sample dimensions: φ<90 mm H<20 mm
  • Operating system : Windows XP/7/8/10

Nanoview_brochure

 

NanoTutor SPM: an AFM with self-made tips and with Tunneling and Force lithography features

Features:

  • Scanning Force Microscope (SFM)
  • Scanning Tunneling Microscope (STM)
  • Spectroscopy and Microlithography SPM
  • User-friendly interface
  • Easy replaceable probes
  • Self-made tips by chemical etching with automated procedure
  • Scanner: 70x70x10 microns
  • Operating system : Windows XP/7

 

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